Design Documents

 

Downloads Design Documents

 

General Information

The geometrical and electrical characteristics of austriamicrosystems' processes are described in the following documents:

Design Rules
Design rules specify all rules necessary to create valid geometrical layouts and include:
  • Definitions
  • General Requirements
  • Process Layer Overview
  • Structure Rules (override Process Layer Rules)
  • Element Rules (override Structure Rules and Process Layer Rules)
  • Periphery Rules
  • Guidelines
  • Recommended Layout Structures

BiCMOS and 50V-CMOS Design Rules are supplements to corresponding CMOS documents.

Process Parameters
Specify all parameters necessary for accurate circuit design and include:
  • General
    • Wafer Cross-Section
    • Operating Conditions
    • Current Densities
  • Process Control Parameters
  • Introduction
  • Structural and Geometrical Parameters
  • MOS Electrical Parameters
  • Bipolar Electrical Parameters
  • Sheet Resistances
  • Contact Resistances
  • Capacitances
  • Diodes
  • Metal3 Module Parameters
  • Poly1-Poly2 Capacitor Module Parameters
  • High Resistive Poly Module Parameters
  • Notes Measurement Conditions
  • Matching Parameter
    • Introduction
    • MOS Transistor Matching Parameter
    • Bipolar Transistor Matching Parameter
    • Resistor Transistor Matching Parameter
    • Notes Measurement Conditions
  • Simulation Models
    • Introduction
    • Summary of Simulation Models
  • Characteristic Curves
    • Introduction
    • MOS Transistor Characteristics
    • Bipolar Transistor Characteristics
    • Nonlinear Resistor Characteristics
    • Zener Diode Characteristics

RF Spice Models
RF simulation models for active and passive devices:
  • Introduction
  • General for all devices
    • Short description including validity range
    • Subcircuit model
    • Main Parameters
    • Characteristic Curves
  • Summary of RF SPICE models
  • Simulator Models and Design Kit Integration
  • Note on S-Parameter Measurements

Noise Parameters
Low frequency noise parameters and models including:
  • Introduction
    • Revision
    • Process Family
    • Related Documents
  • Noise measurements and Parameter Extraction
  • Measurement Setup
  • Flicker Noise Modeling
  • Noise Parameters
    • SPICE parameters
    • BSIM parameters
    • Simulator models
  • Characteristic Noise Curves

Matching Parameters
Mismatch parameters and models for active and passive devices:
  • General
    • Introduction
  • Matching Parameter
    • Introduction
    • MOS Transistor Matching Parameter
    • Bipolar Transistor Matching Parameter
    • Resistor Matching Parameter
    • Capacitor Matching Parameter
    • Notes/Measurement Conditions
  • Characteristic Curves

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